Search results for " Total Ionizing Dose"

showing 2 items of 2 documents

Silicon dosimeters based on Floating Gate Sensor: design, implementation and characterization

2020

A rad-hard monolithic dosimeter has been implemented and characterized in a standard 180 nm CMOS technology. The radiation sensor (C-sensor) is based on a Floating Gate (FG) MOS discharge principle. The output current is processed by a current-to-voltage (I/V) interface and then converted by a 5-bit flash ADC. The dosimeter is re-usable (FG can be recharged) and can detect a dose up to 1krad (Si) with a resolution of 30rad (Si) typical over temperature 0 to 85°C range. The ADC allows easy further signal processing for calibration and averaging, etc. The power consumption of C-sensor plus I/V interface is < 2mW from a 5 V power supply. The overall layout area is less than 0.25mm2. The Rad…

010302 applied physicsSignal processingMaterials scienceDosimeterSettore ING-IND/20 - Misure E Strumentazione Nucleari010308 nuclear & particles physicsbusiness.industryAnalog-to-digital converterHardware_PERFORMANCEANDRELIABILITYFlash ADC01 natural sciencesPower (physics)law.inventionCMOSlawAnalog-to-Digital converter current-to-voltage interfaces Dosimeter edgeless transistors (ELT) Floating Gate MOS radiation hardening by design (RHBD) total ionizing dose (TID)Absorbed dose0103 physical sciencesHardware_INTEGRATEDCIRCUITSCalibrationOptoelectronicsbusiness2020 IEEE 20th Mediterranean Electrotechnical Conference ( MELECON)
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The methodology for active testing of electronic devices under the radiations

2018

The methodology, developed for active testing of electronic devices under the radiations, is presented. The test set-up includes a gamma-ray facility, the hardware board/fixtures and the software tools purposely designed and realized. The methodology is so wide-ranging to allow us the verification of different classes of electronic devices, even if only application examples for static random access memory modules are reported.

business.industryComputer scienceSettore ING-IND/20 - Misure E Strumentazione NucleariTesting methodologies Electronic Devices Total Ionizing Dose Single Event Effects Gamma rays.Electrical engineeringelectronic devicetotal ionizing dosesingle event effectNuclear Energy and Engineeringtesting methodologygamma raylcsh:QC770-798lcsh:Nuclear and particle physics. Atomic energy. RadioactivityElectronicsSafety Risk Reliability and QualitybusinessNuclear Technology and Radiation Protection
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